• vcard
713.374.1664
  • Education
    • LL.M., George Washington University Law School, 1998, Intellectual Property
    • J.D., Thurgood Marshall School of Law, 1997, cum laude
    • B.S., Prairie View A&M University, 1991, Electrical Engineering
  • Bar Jurisdictions
    • Texas, 1997
    • Illinois, 2004
    • District of Columbia, 2000
    • Admitted to practice before the United States Patent and Trademark Office
  • Court Admissions
    • U.S. Supreme Court
    • U.S. Court of Appeals, Federal Circuit
    • U.S. Court of Appeals, Fifth Circuit
    • U.S. District Court, Southern District of Texas
    • U.S. District Court, Northern District of Texas
    • U.S. District Court, Eastern District of Texas
    • U.S. District Court, Northern District of Illinois
    • U.S. District Court, Central District of Illinois

As a shareholder in Intellectual Property Litigation, Jonathan Spivey focuses his practice on complex patent, trade secret, trademark, copyright and unfair competition litigation appeals. He has extensive experience litigating intellectual property matters in numerous district courts involving patent, trademark and copyright infringement, Internet domain disputes, mergers and acquisitions and patent prosecution. His experience includes the electro-mechanical, electrical computer technology, wireless communication, video coding/decoding and software arts.

In addition to litigating intellectual property matters, Jonathan also counsels clients in the strategic development of their IP portfolios. He routinely represents Fortune 500 corporations in transactional matters such as drafting and negotiating technology licenses, transfer, joint development, confidentiality and other intellectual property-related agreements, and conducting intellectual property due diligence investigations. Jonathan has experience as a patent examiner at the United States Patent and Trademark Office and has served as a judicial clerk for the Honorable H. Robert Mayer, former chief judge at the United State Court of Appeals for the Federal Circuit.

text icon Publications & Presentations
Test for Enhanced Damages
Author, IP Magazine
July/August 2016